Specific X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for automated Measurements and Analyses of Coating Thicknesses and Compositions on Very Small Components and Structures on Printed Circuit Boards
The FISCHERSCOPE X-RAY XDV-μ-PCB is a specific x-ray fluorescence measuring instrument with a polycapillary x-ray optics. It has been specially developed for automated measurements and analyses of coating thicknesses and compositions on very small components and structures on printed circuit boards.
Typical fields of application:
• Measurements on very small flat components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)
• Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm (0.004 mils)
• Measurements of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the instrument features electrically changeable primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity. Due to the innovative polycapillary x-ray optics, the instrument measures using an extremely small measurement spot yet with a very high excitation intensity.
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically reduced, saving time and effort.
The fundamental parameter method by FISCHER allows for the analysis of solid specimens and coating systems without calibration.
