The Fischer XRF spectrometers GOLDSCOPE SD 520 and 550 as well as XAN 220, 222, 250 and 252 are now equipped with the in-house developed digital pulse processor DPP+. In combination with the new larger silicon drift detector of 50 mm² effective area.

An even higher count rate – i.e. more but also weaker fluorescence signals from the sample – can be processed with excellent energy resolution.

What does this mean in concrete terms? In short: significant advantages! Compared to the past, the absolute standard deviation can be reduced by up to 45 % at the same measurement time or the same standard deviation can be achieved in one third of the former measurement time. Raise your XRF measurements to a new level – of course with Fischer know-how!

GOLDSCOPE SD 510
GOLDSCOPE SD 515
GOLDSCOPE SD 520
GOLDSCOPE SD 550

X-Ray Fluorescence GOLDSCOPE Instruments Optimized
for Fast, Cost-effective and Non-destructive GOLD ANALYSIS
including Jewellery, Bullion, Coins and Any Precious Metals

Furthermore, the GOLDSCOPE is well suited for determining the thickness of gold coatings on sterling silver and rhodium coatings on gold alloys as well as Silver coatings.

The GOLDSCOPE series comprises four different instruments to fulfil the specific demands from the fast purchase and sale of gold up to the high-precision analysis of precious metals.

Typical fields of application are the analysis of:

  • Jewellery, precious metals and dental alloys
  • Yellow and white gold
  • Platinum and silver
  • Rhodium
  • Alloys and coatings

Outstanding GOLD TESTING accuracy and long-term stability are characteristics of all GOLDSCOPE X-RAY systems from FISCHER. The necessity of recalibration is considerably reduced, saving time and effort. The GOLDSCOPE SD 510 & 515 instruments are equipped with a modern silicon PIN detector, which achieves high accuracy and good detection sensitivity. For even higher resolution, the GOLDSCOPE SDD 520 & 550 instruments offer Silicon Drift Detectors.

The fundamental parameter method by FISCHER allows for the analysis without calibration.

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