Coating Thickness Measurement Using X-Ray Fluorescence
FISCHERSCOPE® X-RAY XUL
New instrument incorporates proven measurement method
The FISCHERSCOPE® X-RAY XUL measures the thickness of all electroplated coatings as well as the thickness and composition of alloy coatings. The system also performs material and fluid analysis according to the X-Ray Fluorescence method according to ASTM B568, DIN 60 987, ISO 3497.
With the XUL, the X-Ray tube and the detector system are located underneath the measuring stage. This results in a bottom to top measurement direction similar to Fischer’s successful instrument series X-RAY 1000/1010/1020. This orientation has advantages for many measurement applications. Fischer is the only manufacturer of X-Ray fluorescence coating thickness measuring instruments to incorporate this practical design.
The unique WinFTM® Software is the core of spectra analysis and measurement processing for the XUL as it is for the entire series of FISCHERSCOPE® X-RAY instruments.
This software enables the measurement of very complex coating systems, without calibration standards and with a predicted measurement accuracy.
