WinFTM Version 6 is a fully integrated software for coating thickness measurement and material analysis.
Newly developed on the foundation of the proven earlier versions of WinFTM, Version 6 represents a considerable improvement in performance and versatility for practical measurement applications.
Together with FISCHER’S new generation of X-RAY instruments using high-resolution semiconductor detectors and focusing x-ray optics, it is now possible to venture into entirely new applications with this new technology.
WinFTM Version 6 is the ideal choice for quick and easy coating thickness measurement and materials analysis.
