FISCHER is your partner for the quality assurance of your Printed Circuit Boards. An extensive product assortment is available for thickness measurement and for the analysis of all coatings used in practical applications. Even complex multi-layer- and alloy coating systems can be tested easily, quickly and accurately using the state-of-the-art FISCHER instruments. FISCHER provides you…
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KK & S Instruments MP0R Coating Thickness Test Instruments. Precise Measurements – Displayed Twice. Small Size, Great Performance. Measure coating thickness easily, quickly and nondestructively. A unit from the MP0R series is optimal for the demands of many measurement requirements. These ‘smart’ instruments automati cally recognize the type of the coated substrate material, e.g., aluminum…
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FISCHER is your partner for the quality assurance of your Printed Circuit Boards. An extensive product assortment is available for thickness measurement and for the analysis of all coatings used in practical applications. Even complex multi-layer- and alloy coating systems can be tested easily, quickly and accurately using the state-of-the-art FISCHER instruments. FISCHER provides you…
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\X-Ray Fluorescence Measuring System for Continuous In-line Measurement and Analysis in Production Processes, on Flat and Stamped Strips, also with Formed and Stamped Contact Areas. The instruments of the FISCHERSCOPE X-RAY 4000 series are innovative, energy dispersive x-ray fluorescence measuring systems (EDXRF) for in-line applications in industrial production sites. They are especially designed for continuous…
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The Measure of Experience X-Ray Fluorescence Measuring Instruments for Coating Thickness Measurement and Materials Analysis Experience counts Whether you are measuring coating thickness or performing materials analysis, FISCHER offers the ideal instruments for most applications. For over 20 years, pioneering work has been done for the continuous development of the FISCHERSCOPE ® X-RAY product line.…
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The FISCHERSCOPE® X-RAY Conti 5000 measures continuously rolling material strips in a contact-free way. The material range comprises even materials such as solar panels with a big measuring area on the surface. Coating thickness and material analysis of practically all metallic layer systems can be performed in one run. The well-designed measuring head is flexible…
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X-Ray Fluorescence Meaurement For “High Reliability” Electronic Compoments Aviation, Aerospace, and Military users of commercial off the shelf components are faced with a potentially dangerous parts shortage. It is possible that electronics thought to contain 3% tin lead specified for high reliability applications will be mislabeled and replaced with 0% lead components. As a result,…
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Non-destructive measurement of hard material coatings • Coating thickness and material analysis according to the X-ray fluorescence method or the magnetic induction method • To control your coating process and insure uniform coating distribution • Martens hardness • For inspection of cobalt leaching Coating thickness measurement according to the X-ray fluorescence method Coating layers TiN,…
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Testing and verifying conformity to RoHS, WEEE and ELV Verifying the reliability of electronics through materials analysis and coating thickness measurements Analysis of multi-layer electronic components General materials testing Analysis of Plating Bath Solutions Brochure Enquiry Form Name (required) Company Name(required) Email (required) Phone Number(required) Country (required) Product Subject Your Message Brochure Enquiry…
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X-Ray Fluorescence in Thin film Solar Cell Manufacturing: Improving cell efficiency and production yield Production quality of thin film solar cells can be accurately and precisely monitored using the X-Ray Fluorescence (XRF) methodology. Specifically tailored inline measurement instruments are available that fulfil the robustness requirements in production environment. Clever software features enable simple setup and…
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For a production engineer, it is desirable to get high quality data of process related parameters such as thickness, concentration and homogeneity of the CIGS-coating shortly after the coating process. This guarantees the opportunity to adjust process parameters as soon as the data indicates deviation from product specifications. The only way to obtain this data…
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WinFTM Version 6 is a fully integrated software for coating thickness measurement and material analysis. Newly developed on the foundation of the proven earlier versions of WinFTM, Version 6 represents a considerable improvement in performance and versatility for practical measurement applications. Together with FISCHER’S new generation of X-RAY instruments using high-resolution semiconductor detectors and focusing…
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Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. It is particularly suited for the analysis of precious metals and their alloys…
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The new FISCHERSCOPE X-RAY XAN series are modern X-Ray fluorescence measuring instruments for coating thickness measurement and material analysis. The XAN 220 is optimized for fast, non-destructive analysis of jewelry, precious metals, dental alloys, yellow and white gold, platinum, silver, rhodium and all jewelry alloys and coatings. Used properly, the XAN 220 can deliver comparable…
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X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys The FISCHERSCOPE X-RAY XAN 220 is an optimized X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. It is particularly suited for the analysis of precious metals and their alloys in composition and…
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High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement The FISCHERSCOPE X-RAY XAN 250 is a high performance, compact and universally applicable x-ray measuring instrument. It is well suited for the non-destructive coating thickness measurement and material analysis. The XAN 250 is especially well suited for measuring and…
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X-ray fluorescence spectrometer with a programmable X/Y-stage and Z-axis for automated measurements of thin coatings and for materials analysis. The FISCHERSCOPE®-X-RAY XDAL®237 is a universally applicable energy-dispersive x-ray spectrometer. It constitutes the next step in the development of the proven FISCHERSCOPE X-RAY XDAL. Like its predecessor, it is particularly well suited for non-destructive measurements of…
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X-ray fluorescence spectrometer for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts. The FISCHERSCOPE®-X-RAY XDLM® instruments are universally applicable energy-dispersive x-ray spectrometers. They constitute the next step in the development of the proven FISCHERSCOPE X-RAY XDLM-C4 model series. Like their predecessors, they are particularly well suited for non-destructive…
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Specific X-Ray Fluorescence Measuring Instruments for Measurements and Analyses of Coating Thicknesses and Compositions on Printed Circuit Boards The FISCHERSCOPE X-RAY XDLM-PCB instruments are specific robust entry-level instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. Typical fields of application: • Measurements on small components and structures on printed circuit…
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X-Ray Fluorescence Measuring Instrument with a Programmable X/Y-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis The FISCHERSCOPE X-RAY XDV-SDD is a universally applicable energy-dispersive x-ray fluorescence measuring instrument. It is especially well suited for measuring and analyzing very thin coatings or small concentrations in the trace analysis. With its…
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