Testing and verifying conformity to RoHS, WEEE and ELV Verifying the reliability of electronics through materials analysis and coating thickness measurements Analysis of multi-layer electronic components General materials testing Analysis of Plating Bath Solutions Brochure Enquiry Form Name (required) Company Name(required) Email (required) Phone Number(required) Country (required) Product Subject Your Message Brochure Enquiry…
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X-Ray Fluorescence in Thin film Solar Cell Manufacturing: Improving cell efficiency and production yield Production quality of thin film solar cells can be accurately and precisely monitored using the X-Ray Fluorescence (XRF) methodology. Specifically tailored inline measurement instruments are available that fulfil the robustness requirements in production environment. Clever software features enable simple setup and…
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For a production engineer, it is desirable to get high quality data of process related parameters such as thickness, concentration and homogeneity of the CIGS-coating shortly after the coating process. This guarantees the opportunity to adjust process parameters as soon as the data indicates deviation from product specifications. The only way to obtain this data…
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WinFTM Version 6 is a fully integrated software for coating thickness measurement and material analysis. Newly developed on the foundation of the proven earlier versions of WinFTM, Version 6 represents a considerable improvement in performance and versatility for practical measurement applications. Together with FISCHER’S new generation of X-RAY instruments using high-resolution semiconductor detectors and focusing…
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Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. It is particularly suited for the analysis of precious metals and their alloys…
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The new FISCHERSCOPE X-RAY XAN series are modern X-Ray fluorescence measuring instruments for coating thickness measurement and material analysis. The XAN 220 is optimized for fast, non-destructive analysis of jewelry, precious metals, dental alloys, yellow and white gold, platinum, silver, rhodium and all jewelry alloys and coatings. Used properly, the XAN 220 can deliver comparable…
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X-Ray Fluorescence Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys The FISCHERSCOPE X-RAY XAN 220 is an optimized X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. It is particularly suited for the analysis of precious metals and their alloys in composition and…
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High Performance X-Ray Fluorescence Measuring Instrument for fast and non-destructive Material Analysis and Coating Thickness Measurement The FISCHERSCOPE X-RAY XAN 250 is a high performance, compact and universally applicable x-ray measuring instrument. It is well suited for the non-destructive coating thickness measurement and material analysis. The XAN 250 is especially well suited for measuring and…
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X-ray fluorescence spectrometer with a programmable X/Y-stage and Z-axis for automated measurements of thin coatings and for materials analysis. The FISCHERSCOPE®-X-RAY XDAL®237 is a universally applicable energy-dispersive x-ray spectrometer. It constitutes the next step in the development of the proven FISCHERSCOPE X-RAY XDAL. Like its predecessor, it is particularly well suited for non-destructive measurements of…
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X-ray fluorescence spectrometer for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts. The FISCHERSCOPE®-X-RAY XDLM® instruments are universally applicable energy-dispersive x-ray spectrometers. They constitute the next step in the development of the proven FISCHERSCOPE X-RAY XDLM-C4 model series. Like their predecessors, they are particularly well suited for non-destructive…
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Specific X-Ray Fluorescence Measuring Instruments for Measurements and Analyses of Coating Thicknesses and Compositions on Printed Circuit Boards The FISCHERSCOPE X-RAY XDLM-PCB instruments are specific robust entry-level instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. Typical fields of application: • Measurements on small components and structures on printed circuit…
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X-Ray Fluorescence Measuring Instrument with a Programmable X/Y-Stage and Z-Axis for Automated Measurements of very thin Coatings and for Trace Analysis The FISCHERSCOPE X-RAY XDV-SDD is a universally applicable energy-dispersive x-ray fluorescence measuring instrument. It is especially well suited for measuring and analyzing very thin coatings or small concentrations in the trace analysis. With its…
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X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for Automated Measurements and Analyses of Coating Thicknesses and Compositions on Very Small Components and Structures The FISCHERSCOPE X-RAY XDV-μ is a universally applicable energy-dis persive xray measuring instrument. It is particularly well suited for non-destructive analyses and measurements of coating thicknesses on very small components…
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Specific X-Ray Fluorescence Measuring Instrument with a Polycapillary X-Ray Optics for automated Measurements and Analyses of Coating Thicknesses and Compositions on Very Small Components and Structures on Printed Circuit Boards The FISCHERSCOPE X-RAY XDV-μ-PCB is a specific x-ray fluorescence measuring instrument with a polycapillary x-ray optics. It has been specially developed for automated measurements and…
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Coating Thickness Measurement Using X-Ray Fluorescence FISCHERSCOPE® X-RAY XUL New instrument incorporates proven measurement method The FISCHERSCOPE® X-RAY XUL measures the thickness of all electroplated coatings as well as the thickness and composition of alloy coatings. The system also performs material and fluid analysis according to the X-Ray Fluorescence method according to ASTM B568, DIN…
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Specific X-Ray Fluorescence Measuring Instrument for Measurements and Analyses of Coating Thicknesses and Compositions on Printed Circuit Boards The FISCHERSCOPE X-RAY XULM-PCB is a specific robust entry-level instrument for measurements and analyses of coating thicknesses and compositions on printed circuit boards. Typical fields of application: • Measurements on small components and structures on printed circuit…
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X-ray spectrometer for non-destructive thickness measurement and material analysis on small components The FISCHERSCOPE X-RAY XULM instruments are compact and universally applicable energy-dispersive x-ray spectrometers. They are well suited for nondestructive thickness measurements and material analysis on small components. To create ideal excitation conditions for every measurement, the XULM features electrically changeable apertures and primary…
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X-ray fluorescence spectrometer for manual or automated coating thickness measurements on protective and decorative coatings, mass-produced parts and pc-boards The FISCHERSCOPE®-X-RAY XDL® instruments are universally applicable energydispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive…
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FISCHER DataCenter Software for Evaluating and Archiving Measurement Data FISCHER DataCenter IP Inspection plan Software for Quality Assurance FISCHER DataCenter Software – Versions The FISCHER DataCenter Software significantly expands the functionality of the FISCHER measuring instruments. Quickly and easily, measurement data can be transferred to the PC and inspection reports can be created and printed.…
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System overview What can be measured? • Thickness of paint, lacquer, plastic coatings, etc. on steel and iron. • Thickness of paint, lacquer or anodized coatings on nonferrous metals. • Thickness of metallic coatings on steel and iron or nonferrous metals. • Thickness of magnetic (e.g., nickel) coatings on electrically nonconducting, nonmagnetic or magnetic substrate…
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